Authors: LABELLA VP SHUSTERMAN Y SCHOWALTER LJ VENTRICE CA

Citation: Vp. Labella et al., MEASUREMENTS OF EPITAXIALLY GROWN PT CAF2/SI(111) STRUCTURES BY BALLISTIC-ELECTRON-EMISSION MICROSCOPY AND SCANNING-TUNNELING-MICROSCOPY/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(3), 1998, pp. 1692-1696

Authors: LABELLA VP VENTRICE CA SCHOWALTER LJ

Citation: Vp. Labella et al., BALLISTIC-ELECTRON-EMISSION MICROSCOPY MEASUREMENTS OF EPITAXIALLY GROWN PT CAF2/SI(111) STRUCTURES/, Applied surface science, 123, 1998, pp. 213-218

Authors: LABELLA VP SCHOWALTER LJ VENTRICE CA

Citation: Vp. Labella et al., SCANNING-TUNNELING-MICROSCOPY AND BALLISTIC-ELECTRON-EMISSION SPECTROSCOPY STUDIES OF MOLECULAR-BEAM EPITAXIALLY GROWN PT CAF2/SI(111) STRUCTURES/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(4), 1997, pp. 1191-1195

Authors: VENTRICE CA LABELLA VP SCHOWALTER LJ

Citation: Ca. Ventrice et al., DESIGN OF A SCANNING TUNNELING MICROSCOPE FOR IN-SITU TOPOGRAPHIC ANDSPECTROSCOPIC MEASUREMENTS WITHIN A COMMERCIAL MOLECULAR-BEAM EPITAXYMACHINE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(3), 1997, pp. 830-835

Authors: VENTRICE CA LABELLA VP RAMASWAMY G YU HP SCHOWALTER LJ

Citation: Ca. Ventrice et al., HOT-ELECTRON SCATTERING AT AU SI(100) SCHOTTKY INTERFACES MEASURED BYTEMPERATURE-DEPENDENT BALLISTIC-ELECTRON-EMISSION MICROSCOPY/, Applied surface science, 104, 1996, pp. 274-281

Authors: VENTRICE CA LABELLA VP RAMASWAMY G YU HP SCHOWALTER LJ

Citation: Ca. Ventrice et al., MEASUREMENT OF HOT-ELECTRON SCATTERING PROCESSES AT AU SI(100) SCHOTTKY INTERFACES BY TEMPERATURE-DEPENDENT BALLISTIC-ELECTRON-EMISSION MICROSCOPY/, Physical review. B, Condensed matter, 53(7), 1996, pp. 3952-3959