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Results: 1-9 |
Results: 9
CONTRAST ENHANCEMENT USING POLARIZATION-MODULATION SCANNING NEAR-FIELD OPTICAL MICROSCOPY (PM-SNOM)
Authors: LACOSTE T HUSER T PRIOLI R HEINZELMANN H
Citation: T. Lacoste et al., CONTRAST ENHANCEMENT USING POLARIZATION-MODULATION SCANNING NEAR-FIELD OPTICAL MICROSCOPY (PM-SNOM), Ultramicroscopy, 71(1-4), 1998, pp. 333-340
SCANNING NEAR-FIELD OPTICAL MICROSCOPY OF CHOLESTERIC LIQUID-CRYSTALS
Authors: HUSER T LACOSTE T HEINZELMANN H KITZEROW HS
Citation: T. Huser et al., SCANNING NEAR-FIELD OPTICAL MICROSCOPY OF CHOLESTERIC LIQUID-CRYSTALS, The Journal of chemical physics, 108(18), 1998, pp. 7876-7880
FARADAY-ROTATION IMAGING BY NEAR-FIELD OPTICAL MICROSCOPY
Authors: LACOSTE T HUSER T HEINZELMANN H
Citation: T. Lacoste et al., FARADAY-ROTATION IMAGING BY NEAR-FIELD OPTICAL MICROSCOPY, Zeitschrift fur Physik. B, Condensed matter, 104(2), 1997, pp. 183-184
0-1-LAWS BY PRESERVATION
Authors: LACOSTE T
Citation: T. Lacoste, 0-1-LAWS BY PRESERVATION, Theoretical computer science, 184(1-2), 1997, pp. 237-245
OPTICAL MICROSCOPY IN THE NANO-WORLD
Authors: POHL DW BACH H BOPP MA DECKERT V DESCOUTS P ECKERT R GUNTHERODT HJ HAFNER C HECHT B HEINZELMANN H HUSER T JOBIN M KELLER U LACOSTE T LAMBELET P MARQUISWEIBLE F MARTIN OJF MEIXNER AJ NECHAY B NOVOTNY L PFEIFFER M PHILIPONA C PLAKHOTNIK T RENN A SAYAH A SEGURA JM SICK B SIEGNER U TARRACH G VAHLDIECK R WILD UP ZEISEL D ZENOBI R
Citation: Dw. Pohl et al., OPTICAL MICROSCOPY IN THE NANO-WORLD, Chimia, 51(10), 1997, pp. 760-767
INSTRUMENTAL DEVELOPMENTS AND RECENT EXPERIMENTS IN NEAR-FIELD OPTICAL MICROSCOPY
Authors: HEINZELMANN H LACOSTE T HUSER T GUNTHERODT HJ HECHT B POHL DW
Citation: H. Heinzelmann et al., INSTRUMENTAL DEVELOPMENTS AND RECENT EXPERIMENTS IN NEAR-FIELD OPTICAL MICROSCOPY, Thin solid films, 273(1-2), 1996, pp. 149-153
SCANNING NEAR-FIELD OPTICAL MICROSCOPY IN BASEL, RUSCHLIKON, AND ZURICH
Authors: HEINZELMANN H HUSER T LACOSTE T GUNTHERODT HJ POHL DW HECHT B NOVOTNY L MARTIN OJF HAFNER CV BAGGENSTOS H WILD UP RENN A
Citation: H. Heinzelmann et al., SCANNING NEAR-FIELD OPTICAL MICROSCOPY IN BASEL, RUSCHLIKON, AND ZURICH, Optical engineering, 34(8), 1995, pp. 2441-2454
SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM) AND ITS APPLICATION IN MINERALOGY
Authors: GUTMANNSBAUER W HUSER T LACOSTE T HEINZELMANN H GUNTHERODT HJ
Citation: W. Gutmannsbauer et al., SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM) AND ITS APPLICATION IN MINERALOGY, Schweizerische Mineralogische und Petrographische Mitteilungen, 75(2), 1995, pp. 259-264
SURFACE NANOSTRUCTURE AND ITS RELATION TO DEPOSITION CONDITIONS OF THIN CARBONACEOUS FILMS AS MEASURED BY AN ATOMIC-FORCE MICROSCOPE
Authors: LEHMBERG H PAGNIA H GRPEL M LACOSTE T
Citation: H. Lehmberg et al., SURFACE NANOSTRUCTURE AND ITS RELATION TO DEPOSITION CONDITIONS OF THIN CARBONACEOUS FILMS AS MEASURED BY AN ATOMIC-FORCE MICROSCOPE, International journal of electronics, 76(5), 1994, pp. 941-946
Risultati: 1-9 |