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Results: 1-10 |
Results: 10
RESIDUAL POLISHING DAMAGE AND SURFACE QUALITY OF COMMERCIAL INP WAFERS - A SCANNING PL STUDY
Authors: LACZIK Z BOOKER GR MOWBRAY A
Citation: Z. Laczik et al., RESIDUAL POLISHING DAMAGE AND SURFACE QUALITY OF COMMERCIAL INP WAFERS - A SCANNING PL STUDY, Materials science & engineering. B, Solid-state materials for advanced technology, 42(1-3), 1996, pp. 217-224
DARK-FIELD AND DIFFERENTIAL PHASE-CONTRAST IMAGING MODES IN CONFOCAL MICROSCOPY USING A HALF-APERTURE STOP
Authors: TOROK P SHEPPARD CJR LACZIK Z
Citation: P. Torok et al., DARK-FIELD AND DIFFERENTIAL PHASE-CONTRAST IMAGING MODES IN CONFOCAL MICROSCOPY USING A HALF-APERTURE STOP, Optik, 103(3), 1996, pp. 101-106
SIMPLE MODIFICATION OF A COMMERCIAL SCANNING LASER MICROSCOPE TO INCORPORATE DARK-FIELD IMAGING
Authors: TOROK P LACZIK Z SKEPPER JN
Citation: P. Torok et al., SIMPLE MODIFICATION OF A COMMERCIAL SCANNING LASER MICROSCOPE TO INCORPORATE DARK-FIELD IMAGING, Journal of Microscopy, 181, 1996, pp. 260-268
ASSESSMENT OF RESIDUAL SUBSURFACE POLISHING DAMAGE IN INP WAFERS BY PHOTOLUMINESCENCE
Authors: LACZIK Z BOOKER GR MOWBRAY A
Citation: Z. Laczik et al., ASSESSMENT OF RESIDUAL SUBSURFACE POLISHING DAMAGE IN INP WAFERS BY PHOTOLUMINESCENCE, Journal of crystal growth, 158(1-2), 1996, pp. 37-42
COMPUTED LIGHT-SCATTERING CROSS-SECTIONS OF OXIDE PARTICLES IN SILICON
Authors: LACZIK Z BOOKER GR
Citation: Z. Laczik et Gr. Booker, COMPUTED LIGHT-SCATTERING CROSS-SECTIONS OF OXIDE PARTICLES IN SILICON, Applied physics letters, 68(23), 1996, pp. 3239-3241
EFFECT OF HALF-STOP LATERAL MISALIGNMENT ON IMAGING OF DARK-FIELD ANDSTEREOSCOPIC CONFOCAL MICROSCOPES
Authors: TOROK P LACZIK Z SHEPPARD CJR
Citation: P. Torok et al., EFFECT OF HALF-STOP LATERAL MISALIGNMENT ON IMAGING OF DARK-FIELD ANDSTEREOSCOPIC CONFOCAL MICROSCOPES, Applied optics, 35(34), 1996, pp. 6732-6739
DISCRETE-DIPOLE-APPROXIMATION-BASED LIGHT-SCATTERING CALCULATIONS FORPARTICLES WITH A REAL REFRACTIVE-INDEX SMALLER THAN UNITY
Authors: LACZIK Z
Citation: Z. Laczik, DISCRETE-DIPOLE-APPROXIMATION-BASED LIGHT-SCATTERING CALCULATIONS FORPARTICLES WITH A REAL REFRACTIVE-INDEX SMALLER THAN UNITY, Applied optics, 35(19), 1996, pp. 3736-3745
ELECTROMAGNETIC DIFFRACTION OF LIGHT FOCUSED THROUGH A PLANAR INTERFACE BETWEEN MATERIALS OF MISMATCHED REFRACTIVE-INDEXES - AN INTEGRAL-REPRESENTATION (VOL 12, PG 325, 1995)
Authors: TOROK P VARGA P LACZIK Z BOOKER GR
Citation: P. Torok et al., ELECTROMAGNETIC DIFFRACTION OF LIGHT FOCUSED THROUGH A PLANAR INTERFACE BETWEEN MATERIALS OF MISMATCHED REFRACTIVE-INDEXES - AN INTEGRAL-REPRESENTATION (VOL 12, PG 325, 1995), Journal of the Optical Society of America. A, Optics, image science,and vision., 12(7), 1995, pp. 1605-1605
ELECTROMAGNETIC DIFFRACTION OF LIGHT FOCUSED THROUGH A PLANAR INTERFACE BETWEEN MATERIALS OF MISMATCHED REFRACTIVE-INDEXES - AN INTEGRAL-REPRESENTATION
Authors: TOROK P VARGA P LACZIK Z BOOKER GR
Citation: P. Torok et al., ELECTROMAGNETIC DIFFRACTION OF LIGHT FOCUSED THROUGH A PLANAR INTERFACE BETWEEN MATERIALS OF MISMATCHED REFRACTIVE-INDEXES - AN INTEGRAL-REPRESENTATION, Journal of the Optical Society of America. A, Optics, image science,and vision., 12(2), 1995, pp. 325-332
COMPARISON OF SURFACE POLISHING TECHNIQUES USED FOR INP WAFERS
Authors: LACZIK Z BOOKER GR MOWBRAY A
Citation: Z. Laczik et al., COMPARISON OF SURFACE POLISHING TECHNIQUES USED FOR INP WAFERS, Journal of crystal growth, 153(1-2), 1995, pp. 1-5
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