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Results: 1-19 |
Results: 19
ELECTRICAL-PROPERTIES OF THIN POLYOXIDES GROWN AT A LOW-TEMPERATURE USING MICROWAVE OXYGEN PLASMA
Authors: SAHA C BERA LK RAY SK MAITI CK LAHIRI SK
Citation: C. Saha et al., ELECTRICAL-PROPERTIES OF THIN POLYOXIDES GROWN AT A LOW-TEMPERATURE USING MICROWAVE OXYGEN PLASMA, Semiconductor science and technology, 13(6), 1998, pp. 599-602
CHARACTERIZATION OF PHASE-TRANSFORMATION IN TITANIUM POLYCIDE FILMS
Authors: UMAPATHI B DAS S KAL S LAHIRI SK
Citation: B. Umapathi et al., CHARACTERIZATION OF PHASE-TRANSFORMATION IN TITANIUM POLYCIDE FILMS, Semiconductor science and technology (Print), 13(10), 1998, pp. 1158-1163
DESIGN OPTIONS FOR SAW IF FILTERS USED IN WIRELESS APPLICATIONS
Authors: KULKARNI RG LAHIRI SK
Citation: Rg. Kulkarni et Sk. Lahiri, DESIGN OPTIONS FOR SAW IF FILTERS USED IN WIRELESS APPLICATIONS, Microwave journal, 41(1), 1998, pp. 114
MATRIX-BASED ANALYTICAL MODEL OF CRITICAL COUPLING LENGTH OF TITANIUMIN-DIFFUSED INTEGRATED-OPTIC DIRECTIONAL COUPLER ON LITHIUM-NIOBATE SUBSTRATE
Authors: GANGULY P BISWAS JC LAHIRI SK
Citation: P. Ganguly et al., MATRIX-BASED ANALYTICAL MODEL OF CRITICAL COUPLING LENGTH OF TITANIUMIN-DIFFUSED INTEGRATED-OPTIC DIRECTIONAL COUPLER ON LITHIUM-NIOBATE SUBSTRATE, Fiber and integrated optics, 17(2), 1998, pp. 139-155
MODELING OF TITANIUM INDIFFUSED LITHIUM-NIOBATE CHANNEL WAVE-GUIDE BENDS - A MATRIX APPROACH
Authors: GANGULY P BISWAS JC LAHIRI SK
Citation: P. Ganguly et al., MODELING OF TITANIUM INDIFFUSED LITHIUM-NIOBATE CHANNEL WAVE-GUIDE BENDS - A MATRIX APPROACH, Optics communications, 155(1-3), 1998, pp. 125-134
KINETICS OF OXIDATION OF COPPER ALLOY LEADFRAMES
Authors: LAHIRI SK SINGH NKW HENG KW ANG L GOH LC
Citation: Sk. Lahiri et al., KINETICS OF OXIDATION OF COPPER ALLOY LEADFRAMES, Microelectronics, 29(6), 1998, pp. 335-341
ION-ASSISTED GROWTH AND CHARACTERIZATION OF POLYCRYSTALLINE SILICON AND SILICON-GERMANIUM FILMS
Authors: SAHA C DAS S RAY SK LAHIRI SK
Citation: C. Saha et al., ION-ASSISTED GROWTH AND CHARACTERIZATION OF POLYCRYSTALLINE SILICON AND SILICON-GERMANIUM FILMS, Journal of applied physics, 83(8), 1998, pp. 4472-4476
EXAMINE THE EFFECTS OF ALIASING ON NONSYMMETRICAL FILTERS
Authors: KULKARNI RG ANANDA HV LAHIRI SK
Citation: Rg. Kulkarni et al., EXAMINE THE EFFECTS OF ALIASING ON NONSYMMETRICAL FILTERS, Microwaves & RF, 36(8), 1997, pp. 118
TEOS-BASED PECVD OF SILICON DIOXIDE FOR VLSI APPLICATIONS
Authors: RAY SK MAITI CK LAHIRI SK CHAKRABARTI NB
Citation: Sk. Ray et al., TEOS-BASED PECVD OF SILICON DIOXIDE FOR VLSI APPLICATIONS, Advanced materials for optics and electronics, 6(2), 1996, pp. 73-82
EFFECT OF THERMAL CYCLING ON STRESSES IN THIN SILICON-NITRIDE AND SILICON-CARBIDE FILMS
Authors: LIM CW TOH CC FU JK LAHIRI SK
Citation: Cw. Lim et al., EFFECT OF THERMAL CYCLING ON STRESSES IN THIN SILICON-NITRIDE AND SILICON-CARBIDE FILMS, Journal of materials science letters, 15(24), 1996, pp. 2177-2179
SIMULATION OF REFRACTIVE-INDEX PROFILES FOR TITANIUM INDIFFUSED LITHIUM-NIOBATE CHANNEL WAVE-GUIDES
Authors: GANGULY P SEN DC DATT S BISWAS JC LAHIRI SK
Citation: P. Ganguly et al., SIMULATION OF REFRACTIVE-INDEX PROFILES FOR TITANIUM INDIFFUSED LITHIUM-NIOBATE CHANNEL WAVE-GUIDES, Fiber and integrated optics, 15(2), 1996, pp. 135-147
LARGE ENHANCEMENT OF PHOTOLUMINESCENCE FROM POROUS SILICON FILMS BY POST-ANODIZATION TREATMENT IN BOILING HYDROGEN-PEROXIDE
Authors: RAO BVRM BASU PK BISWAS JC LAHIRI SK GHOSH S BOSE DN
Citation: Bvrm. Rao et al., LARGE ENHANCEMENT OF PHOTOLUMINESCENCE FROM POROUS SILICON FILMS BY POST-ANODIZATION TREATMENT IN BOILING HYDROGEN-PEROXIDE, Solid state communications, 97(5), 1996, pp. 417-418
CHEMICALLY ASSISTED ION-BEAM ETCHING OF SILICON AND SILICON DIOXIDE USING SF6
Authors: RAY SK MAITI CK LAHIRI SK
Citation: Sk. Ray et al., CHEMICALLY ASSISTED ION-BEAM ETCHING OF SILICON AND SILICON DIOXIDE USING SF6, Plasma chemistry and plasma processing, 15(4), 1995, pp. 711-720
PHASE-SEPARATION IN GLASSES CONTAINING LEAD, BISMUTH AND GALLIUM OXIDES
Authors: TAN CT OOI TN LAHIRI SK
Citation: Ct. Tan et al., PHASE-SEPARATION IN GLASSES CONTAINING LEAD, BISMUTH AND GALLIUM OXIDES, Journal of materials science letters, 14(6), 1995, pp. 405-407
EFFECT OF REACTIVE-ION BOMBARDMENT ON THE PROPERTIES OF SILICON-NITRIDE AND OXYNITRIDE FILMS DEPOSITED BY ION-BEAM SPUTTERING
Authors: RAY SK DAS S MAITI CK LAHIRI SK CHAKRABORTI NB
Citation: Sk. Ray et al., EFFECT OF REACTIVE-ION BOMBARDMENT ON THE PROPERTIES OF SILICON-NITRIDE AND OXYNITRIDE FILMS DEPOSITED BY ION-BEAM SPUTTERING, Journal of applied physics, 75(12), 1994, pp. 8145-8152
ELECTRICAL TRIMMING OF ION-BEAM-SPUTTERED POLYSILICON RESISTORS BY HIGH-CURRENT PULSES
Authors: DAS S LAHIRI SK
Citation: S. Das et Sk. Lahiri, ELECTRICAL TRIMMING OF ION-BEAM-SPUTTERED POLYSILICON RESISTORS BY HIGH-CURRENT PULSES, I.E.E.E. transactions on electron devices, 41(8), 1994, pp. 1429-1434
A LARGE-BIAS CONDUCTION MODEL OF POLYCRYSTALLINE SILICON FILMS
Authors: DAS S LAHIRI SK
Citation: S. Das et Sk. Lahiri, A LARGE-BIAS CONDUCTION MODEL OF POLYCRYSTALLINE SILICON FILMS, I.E.E.E. transactions on electron devices, 41(4), 1994, pp. 524-532
MICROSTRUCTURAL AND ELECTRICAL CHARACTERIZATION OF ION-BEAM-SPUTTEREDPOLYSILICON FILMS FOR MICROELECTRONIC APPLICATIONS
Authors: DAS S LAHIRI SK CHAUDHURI AK
Citation: S. Das et al., MICROSTRUCTURAL AND ELECTRICAL CHARACTERIZATION OF ION-BEAM-SPUTTEREDPOLYSILICON FILMS FOR MICROELECTRONIC APPLICATIONS, Thin solid films, 235(1-2), 1993, pp. 215-221
SIMULATION OF THE FREQUENCY-RESPONSE OF THE ADMITTANCE AND SCATTERINGPARAMETERS OF AN SAW IDT
Authors: ZIAUDEEN,"LAHIRI SK
Citation: Sk. Ziaudeen,"lahiri, SIMULATION OF THE FREQUENCY-RESPONSE OF THE ADMITTANCE AND SCATTERINGPARAMETERS OF AN SAW IDT, International journal of electronics, 75(3), 1993, pp. 499-510
Risultati: 1-19 |