Authors:
KOPF RF
HAMM RA
RYAN RW
BURM J
TATE A
CHEN YK
GEORGIOU G
LANG DV
REN F
Citation: Rf. Kopf et al., EVALUATION OF ENCAPSULATION AND PASSIVATION OF INGAAS INP DHBT DEVICES FOR LONG-TERM RELIABILITY/, Journal of electronic materials, 27(8), 1998, pp. 954-960