Authors: LAVINE JP BANGHART EK

Citation: Jp. Lavine et Ek. Banghart, THE EFFECT OF POTENTIAL OBSTACLES ON CHARGE-TRANSFER IN IMAGE SENSORS, I.E.E.E. transactions on electron devices, 44(10), 1997, pp. 1593-1598

Authors: DATAR SA GOVE HE TENG RTD LAVINE JP

Citation: Sa. Datar et al., AMS STUDIES OF THE DIFFUSION OF CHLORINE IN SILICON-WAFERS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 99(1-4), 1995, pp. 549-552

Authors: NICHOLS DN STEVENS EG BURKY BC STANCAMPIANO CV LEE YR LEE TH KOSMAN SL LOSEE DL LAVINE JP TOROK GR KHOSLA RP

Citation: Dn. Nichols et al., HIGH-RESOLUTION INTERLINE IMAGE SENSORS USING 2-PHASE CCD TECHNOLOGY, International journal of imaging systems and technology, 5(4), 1994, pp. 323-329

Authors: STEVENS EG LAVINE JP

Citation: Eg. Stevens et Jp. Lavine, AN ANALYTICAL, APERTURE, AND 2-LAYER CARRIER DIFFUSION MTF AND QUANTUM EFFICIENCY MODEL FOR SOLID-STATE IMAGE SENSORS, I.E.E.E. transactions on electron devices, 41(10), 1994, pp. 1753-1760