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Results: 3
SIGE SIGEO2 INTERFACE DEFECTS
Authors:
LEBIB S SCHOISSWOHL M CANTIN JL VONBARDELEBEN HJ
Citation:
S. Lebib et al., SIGE SIGEO2 INTERFACE DEFECTS, Thin solid films, 294(1-2), 1997, pp. 242-245
ANODIC-OXIDATION OF P-TYPE AND P(-TYPE POROUS SILICON - SURFACE STRUCTURAL TRANSFORMATIONS AND OXIDE FORMATION())
Authors:
CANTIN JL SCHOISSWOHL M GROSMAN A LEBIB S ORTEGA C VONBARDELEBEN HJ VAZSONYI E JALSOVSZKY G EROSTYAK J
Citation:
Jl. Cantin et al., ANODIC-OXIDATION OF P-TYPE AND P(-TYPE POROUS SILICON - SURFACE STRUCTURAL TRANSFORMATIONS AND OXIDE FORMATION()), Thin solid films, 276(1-2), 1996, pp. 76-79
PHOTOLUMINESCENCE AND RAMAN-STUDY OF POROUS SIGE
Authors:
SCHOISSWOHL M ROSENBAUER M CANTIN JL LEBIB S VONBARDELEBEN HJ FAVE JL CERNOGORA J AMATO G ROSSI A
Citation:
M. Schoisswohl et al., PHOTOLUMINESCENCE AND RAMAN-STUDY OF POROUS SIGE, Journal of applied physics, 79(12), 1996, pp. 9301-9304
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