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IN-SITU SURVEY SYSTEM OF RESISTIVE AND THERMOELECTRIC PROPERTIES OF EITHER PURE OR MIXED MATERIALS IN THIN-FILMS EVAPORATED UNDER ULTRA-HIGH-VACUUM
Authors: LECHEVALLIER L LEHUEROU JY RICHON G SARRAU JM GOUAULT J
Citation: L. Lechevallier et al., IN-SITU SURVEY SYSTEM OF RESISTIVE AND THERMOELECTRIC PROPERTIES OF EITHER PURE OR MIXED MATERIALS IN THIN-FILMS EVAPORATED UNDER ULTRA-HIGH-VACUUM, Journal de physique. III, 5(4), 1995, pp. 409-418
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