Authors: LEONG JK WILLIAMS CC OLSON JM

Citation: Jk. Leong et al., EVIDENCE OF INTERNAL ELECTRIC-FIELDS IN GAINP2 BY SCANNING CAPACITANCE AND NEAR-FIELD SCANNING OPTICAL MICROSCOPY, Physical review. B, Condensed matter, 56(3), 1997, pp. 1472-1478

Authors: LEONG JK MCMURRAY J WILLIAMS CC STRINGFELLOW GB

Citation: Jk. Leong et al., SPATIAL-MAPPING OF ORDERED AND DISORDERED DOMAINS OF GAINP BY NEAR-FIELD SCANNING OPTICAL MICROSCOPY AND SCANNING CAPACITANCE MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(4), 1996, pp. 3113-3116

Authors: LEONG JK WILLIAMS CC OLSON JM FROYEN S

Citation: Jk. Leong et al., EVIDENCE FOR INTERNAL ELECTRIC-FIELDS IN 2 VARIANT ORDERED GAINP OBTAINED BY SCANNING CAPACITANCE MICROSCOPY, Applied physics letters, 69(26), 1996, pp. 4081-4083

Authors: LEONG JK WILLIAMS CC

Citation: Jk. Leong et Cc. Williams, SHEAR FORCE MICROSCOPY WITH CAPACITANCE DETECTION FOR NEAR-FIELD SCANNING OPTICAL MICROSCOPY, Applied physics letters, 66(11), 1995, pp. 1432-1434