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Authors: RADING D LIEBING V BECKER G FUCHS H BENNINGHOVEN A
Citation: D. Rading et al., INVESTIGATION OF ELECTRON-INDUCED DAMAGING OF MOLECULAR OVERLAYERS BYIMAGING STATIC SECONDARY-ION MASS-SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(6), 1998, pp. 3449-3454

Authors: DEIMEL M RULLE H LIEBING V BENNINGHOVEN A
Citation: M. Deimel et al., STUDY OF MOLECULAR-SURFACE DIFFUSION BY IMAGING STATIC SECONDARY-ION MASS-SPECTROMETRY (SIMS) - POLYMERS ON AG-SURFACES, Applied surface science, 134(1-4), 1998, pp. 271-274
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