Authors:
RADING D
LIEBING V
BECKER G
FUCHS H
BENNINGHOVEN A
Citation: D. Rading et al., INVESTIGATION OF ELECTRON-INDUCED DAMAGING OF MOLECULAR OVERLAYERS BYIMAGING STATIC SECONDARY-ION MASS-SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(6), 1998, pp. 3449-3454
Authors:
DEIMEL M
RULLE H
LIEBING V
BENNINGHOVEN A
Citation: M. Deimel et al., STUDY OF MOLECULAR-SURFACE DIFFUSION BY IMAGING STATIC SECONDARY-ION MASS-SPECTROMETRY (SIMS) - POLYMERS ON AG-SURFACES, Applied surface science, 134(1-4), 1998, pp. 271-274