Authors:
NOYAN IC
JORDANSWEET J
LINIGER EG
KALDOR SK
Citation: Ic. Noyan et al., CHARACTERIZATION OF SUBSTRATE THIN-FILM INTERFACES WITH X-RAY MICRODIFFRACTION/, Applied physics letters, 72(25), 1998, pp. 3338-3340
Citation: Md. Thouless et al., DELAMINATION FROM EDGE FLAWS, Proceedings - Royal Society. Mathematical and physical sciences, 447(1930), 1994, pp. 271-279
Authors:
COOK RF
LINIGER EG
STEINBRECH RW
DEUERLER F
Citation: Rf. Cook et al., SIGMOIDAL INDENTATION-STRENGTH CHARACTERISTICS OF POLYCRYSTALLINE ALUMINA, Journal of the American Ceramic Society, 77(2), 1994, pp. 303-314
Citation: Eg. Liniger et Rf. Cook, A CONTROLLED FLAW TECHNIQUE FOR LIFETIME CHARACTERIZATION, Journal of the American Ceramic Society, 76(8), 1993, pp. 2123-2126