Authors: WALTER GH WEBER W BREDERLOW R JURK R LINNENBANK CG SCHLUNDER C SCHMITTLANDSIEDEL D THEWES R

Citation: Gh. Walter et al., PRECISE QUANTITATIVE-EVALUATION OF THE HOT-CARRIER-INDUCED DRAIN SERIES RESISTANCE DEGRADATION IN LATID-N-MOSFETS, Microelectronics and reliability, 38(6-8), 1998, pp. 1063-1068