Citation: Ez. Luo et al., PROBING CONDUCTING PARTICLES BURIED IN A NI-X(SIO2)(1-X) COMPOSITE BYCONDUCTING ATOMIC-FORCE MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 1953-1957
Citation: Ez. Luo et al., IDENTIFYING CONDUCTING PHASE FROM THE INSULATING MATRIX IN PERCOLATING METAL-INSULATOR NANOCOMPOSITES BY CONDUCTING ATOMIC-FORCE MICROSCOPY, Applied physics A: Materials science & processing, 66, 1998, pp. 1171-1174
Authors:
CHEN ZY
YU YH
ZHAO JP
WANG X
YANG SQ
SHI TS
LIU XH
WONG SP
WILSON IH
XU JB
LUO EZ
Citation: Zy. Chen et al., OPTICAL-PROPERTIES IN INFRARED REGION OF NITROGEN-INCORPORATED AMORPHOUS-CARBON FILMS, DIAMOND AND RELATED MATERIALS, 7(2-5), 1998, pp. 491-494
Authors:
CHEN ZY
ZHAO JP
YU YH
WANG X
YANG SQ
SHI TS
LIU XH
LUO EZ
XU JB
WILSON IH
Citation: Zy. Chen et al., INFLUENCE OF ION ENERGY ON THE SURFACE-MORPHOLOGY OF TETRAHEDRAL AMORPHOUS-CARBON FILMS, Journal of materials science letters, 17(4), 1998, pp. 335-337
Citation: Ez. Luo et al., PROBING ELECTRON CONDUCTION AT THE MICROSCOPIC LEVEL IN PERCOLATING NANOCOMPOSITES BY CONDUCTING ATOMIC-FORCE MICROSCOPY, Physical review. B, Condensed matter, 57(24), 1998, pp. 15120-15123
Citation: J. Wollschlager et al., DIFFRACTION CHARACTERIZATION OF ROUGH FILMS FORMED UNDER STABLE AND UNSTABLE GROWTH-CONDITIONS, Physical review. B, Condensed matter, 57(24), 1998, pp. 15541-15552
Authors:
CHEN DH
WONG SP
CHEUNG WY
WU W
LUO EZ
XU JB
WILSON IH
KWOK RWM
Citation: Dh. Chen et al., ELECTRON FIELD-EMISSION FROM SIC SI HETEROSTRUCTURES SYNTHESIZED BY CARBON IMPLANTATION USING A METAL VAPOR VACUUM-ARC ION-SOURCE/, Applied physics letters, 72(15), 1998, pp. 1926-1928
Citation: Ez. Luo et al., RESONANT CONDUCTING IN NANO-PATTERNING THE HYDROGEN-PASSIVATED SI(100) BY ATOMIC-FORCE MICROSCOPY, Applied physics letters, 71(14), 1997, pp. 2035-2037
Citation: Ez. Luo et al., COMPETING DESORPTION PATHWAYS DURING EPITAXIAL-GROWTH - LEEM INVESTIGATION OF CU W(110) HETEROEPITAXY/, Physical review. B, Condensed matter, 54(20), 1996, pp. 14673-14678
Authors:
LUO EZ
MA JX
XU JB
WILSON IH
PAKHOMOV AB
YAN X
Citation: Ez. Luo et al., PROBING THE CONDUCTING PATHS IN A METAL-INSULATOR COMPOSITE BY CONDUCTING ATOMIC-FORCE MICROSCOPY, Journal of physics. D, Applied physics, 29(12), 1996, pp. 3169-3172
Citation: Ez. Luo et al., SPA-LEED STUDIES OF GROWTH OF AG ON AG(111) AT LOW-TEMPERATURES, Applied physics A: Materials science & processing, 60(1), 1995, pp. 19-25