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Results: 1-15 |
Results: 15

Authors: LUO EZ WILSON IH XU JB MA JX YAN X
Citation: Ez. Luo et al., PROBING CONDUCTING PARTICLES BURIED IN A NI-X(SIO2)(1-X) COMPOSITE BYCONDUCTING ATOMIC-FORCE MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 1953-1957

Authors: LUO EZ XU JB WU W WILSON IH ZHAO B YAN X
Citation: Ez. Luo et al., IDENTIFYING CONDUCTING PHASE FROM THE INSULATING MATRIX IN PERCOLATING METAL-INSULATOR NANOCOMPOSITES BY CONDUCTING ATOMIC-FORCE MICROSCOPY, Applied physics A: Materials science & processing, 66, 1998, pp. 1171-1174

Authors: CHEN ZY YU YH ZHAO JP WANG X YANG SQ SHI TS LIU XH WONG SP WILSON IH XU JB LUO EZ
Citation: Zy. Chen et al., OPTICAL-PROPERTIES IN INFRARED REGION OF NITROGEN-INCORPORATED AMORPHOUS-CARBON FILMS, DIAMOND AND RELATED MATERIALS, 7(2-5), 1998, pp. 491-494

Authors: CHEN ZY ZHAO JP YU YH WANG X YANG SQ SHI TS LIU XH LUO EZ XU JB WILSON IH
Citation: Zy. Chen et al., INFLUENCE OF ION ENERGY ON THE SURFACE-MORPHOLOGY OF TETRAHEDRAL AMORPHOUS-CARBON FILMS, Journal of materials science letters, 17(4), 1998, pp. 335-337

Authors: LUO EZ WILSON IH YAN X XU JB
Citation: Ez. Luo et al., PROBING ELECTRON CONDUCTION AT THE MICROSCOPIC LEVEL IN PERCOLATING NANOCOMPOSITES BY CONDUCTING ATOMIC-FORCE MICROSCOPY, Physical review. B, Condensed matter, 57(24), 1998, pp. 15120-15123

Authors: WOLLSCHLAGER J LUO EZ HENZLER M
Citation: J. Wollschlager et al., DIFFRACTION CHARACTERIZATION OF ROUGH FILMS FORMED UNDER STABLE AND UNSTABLE GROWTH-CONDITIONS, Physical review. B, Condensed matter, 57(24), 1998, pp. 15541-15552

Authors: CHEN DH WONG SP CHEUNG WY WU W LUO EZ XU JB WILSON IH KWOK RWM
Citation: Dh. Chen et al., ELECTRON FIELD-EMISSION FROM SIC SI HETEROSTRUCTURES SYNTHESIZED BY CARBON IMPLANTATION USING A METAL VAPOR VACUUM-ARC ION-SOURCE/, Applied physics letters, 72(15), 1998, pp. 1926-1928

Authors: LUO EZ WILSON IH XU JB MA JX
Citation: Ez. Luo et al., RESONANT CONDUCTING IN NANO-PATTERNING THE HYDROGEN-PASSIVATED SI(100) BY ATOMIC-FORCE MICROSCOPY, Applied physics letters, 71(14), 1997, pp. 2035-2037

Authors: LUO EZ CAI Q CHUNG WF ALTMAN MS
Citation: Ez. Luo et al., INTERFACE EFFECTS IN MELTING OF PB CLUSTERS ON THE CU(111) SURFACE, Applied surface science, 92, 1996, pp. 331-334

Authors: LUO EZ CAI Q CHUNG WF ORR BG ALTMAN MS
Citation: Ez. Luo et al., COMPETING DESORPTION PATHWAYS DURING EPITAXIAL-GROWTH - LEEM INVESTIGATION OF CU W(110) HETEROEPITAXY/, Physical review. B, Condensed matter, 54(20), 1996, pp. 14673-14678

Authors: LUO EZ MA JX XU JB WILSON IH PAKHOMOV AB YAN X
Citation: Ez. Luo et al., PROBING THE CONDUCTING PATHS IN A METAL-INSULATOR COMPOSITE BY CONDUCTING ATOMIC-FORCE MICROSCOPY, Journal of physics. D, Applied physics, 29(12), 1996, pp. 3169-3172

Authors: LUO EZ WOLLSCHLAGER J WEGNER F HENZLER M
Citation: Ez. Luo et al., SPA-LEED STUDIES OF GROWTH OF AG ON AG(111) AT LOW-TEMPERATURES, Applied physics A: Materials science & processing, 60(1), 1995, pp. 19-25

Authors: LUO EZ HEUN S KENNEDY M WOLLSCHLAGER J HENZLER M
Citation: Ez. Luo et al., SURFACE-ROUGHNESS AND CONDUCTIVITY OF THIN AG FILMS, Physical review. B, Condensed matter, 49(7), 1994, pp. 4858-4865

Authors: CHEN LJ WANG N LUO EZ
Citation: Lj. Chen et al., JELLIUM SPHERE MODEL IN OVERLAYER-SUBSTRATE SYSTEMS, Journal de physique. I, 3(4), 1993, pp. 1053-1058

Authors: CHEN LJ WANG N LUO EZ
Citation: Lj. Chen et al., AB-INITIO INVESTIGATION OF THE CS IR(001) SYSTEM/, Journal of physics. D, Applied physics, 26(8), 1993, pp. 1316-1318
Risultati: 1-15 |