Authors: Salome, P Leroux, C Mariolle, D Lafond, D Chante, JP Crevel, P Reimbold, G

Citation: P. Salome et al., An attempt to explain thermally induced soft failures during low level ESDstresses: study of the differences between soft and hard NMOS failures, MICROEL REL, 38(11), 1998, pp. 1763-1772