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Authors:
Einfeld, J
Lahl, P
Kutzner, R
Wordenweber, R
Kastner, G
Citation: J. Einfeld et al., Reduction of the microwave surface resistance in YBCO thin films by microscopic defects, PHYSICA C, 351(2), 2001, pp. 103-117
Citation: P. Lahl et al., Correlation of power handling capability and intermodulation distortion inYBa2Cu3O7-delta thin films, APPL PHYS L, 79(4), 2001, pp. 512-514