Authors: Nelson, AJ van Buuren, T Miller, E Land, TA Bostedt, C Franco, N Whitman, PK Baisden, PA Terminello, LJ Callcott, TA

Citation: Aj. Nelson et al., X-ray absorption analysis of KDP optics, J ELEC SPEC, 114, 2001, pp. 873-878

Authors: Land, TA De Yoreo, JJ

Citation: Ta. Land et Jj. De Yoreo, The evolution of growth modes and activity of growth sources on canavalin investigated by in situ atomic force microscopy, J CRYST GR, 208(1-4), 2000, pp. 623-637

Authors: Land, TA De Yoreo, JJ Martin, TL Palmore, GT

Citation: Ta. Land et al., A comparison of growth Hillock structure and step dynamics on KDP {100} and {101} surfaces using force microscopy, CRYSTALLO R, 44(4), 1999, pp. 655-666

Authors: Land, TA Martin, TL Potapenko, S Palmore, GT De Yoreo, JJ

Citation: Ta. Land et al., Recovery of surfaces from impurity poisoning during crystal growth, NATURE, 399(6735), 1999, pp. 442-445