Authors: Landau, SA Junghans, N Weiss, PA Kolbesen, BO Olbrich, A Schindler, G Hartner, W Hintermaier, F Dehm, C Mazure, C

Citation: Sa. Landau et al., Scanning probe microscopy - a tool for the investigation of high-k materials, APPL SURF S, 157(4), 2000, pp. 387-392