Authors:
Utriainen, M
Lattu, H
Viirola, H
Niinisto, L
Resch, R
Friedbacher, G
Citation: M. Utriainen et al., Atomic force microscopy studies of SnO2 thin film microstructures deposited by atomic layer epitaxy, MIKROCH ACT, 133(1-4), 2000, pp. 119-123