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Citation: Ll. Cheng et al., Compositional and morphological study of reactive ion beam deposited AlN thin films, NUCL INST B, 169, 2000, pp. 94-97

Authors: Lei, YM Yu, YH Cheng, LL Ren, CX Zou, SC Wong, SP Chen, DH Wilson, IH

Citation: Ym. Lei et al., IR studies of reactive DC magnetron sputtered SiC films on silicon using effective medium theory, MATER LETT, 43(4), 2000, pp. 215-219

Authors: Lei, YM Yu, YH Cheng, LL Ren, CX Zou, SC

Citation: Ym. Lei et al., Auger electron spectroscopy study of SiC thin films deposited on silicon, VACUUM, 58(4), 2000, pp. 602-608

Authors: Lei, YM Yu, YH Ren, CX Zou, SC Chen, DH Wong, SP Wilson, IH

Citation: Ym. Lei et al., Compositional and structural studies of DC magnetron sputtered SiC films on Si(111), THIN SOL FI, 365(1), 2000, pp. 53-57

Authors: Lei, YM Yu, YH Cheng, LL Sundaraval, B Luo, EZ Ren, CX Zou, SC Wong, SP Chen, DH Wilson, IH

Citation: Ym. Lei et al., Investigation and modeling of the infrared optical properties of direct current sputtered SiC films on silicon, J APPL PHYS, 88(5), 2000, pp. 3053-3058