Authors:
Weiss, C
Knoth, J
Schwenke, H
Geisler, H
Lerche, J
Schulz, R
Ullrich, HJ
Citation: C. Weiss et al., Potential of total reflection and grazing incidence XRF for contamination and process control in semiconductor fabrication, MIKROCH ACT, 133(1-4), 2000, pp. 65-68
Citation: C. Jeffrey et J. Lerche, Stating the difference: State, discourse and class reproduction in Uttar Pradesh, India, DEVELOP CHA, 31(4), 2000, pp. 857-878
Authors:
Northoff, G
Nagel, D
Danos, P
Leschinger, A
Lerche, J
Bogerts, B
Citation: G. Northoff et al., Impairment in visual-spatial function in catatonia: a neuropsychological investigation, SCHIZOPHR R, 37(2), 1999, pp. 133-147