Authors:
Pierunek, S
Pogany, D
Autran, JL
Leroy, B
Citation: S. Pierunek et al., Study of hot carrier degradation in dram cells combining random telegraph signal and charge pumping measurements, J NON-CRYST, 245, 1999, pp. 59-66
Citation: B. Leroy et al., Reverse short and narrow channel effects in n and p transistors: quantification of the enhanced diffusion and the gate oxide thickness increase, J NON-CRYST, 245, 1999, pp. 79-84
Citation: B. Leroy, Royal accession in Castile from the thirteenth-century to the fifteenth-century: The special and exceptional ceremonies, MOYEN AGE, 104(3-4), 1998, pp. 473-493