Authors: Ayache, J Thorel, A Lesuer, J Dahmen, U

Citation: J. Ayache et al., Characterization of three-dimensional grain boundary topography in a YBa2Cu3O7-d thin film bicrystal grown on a SrTiO3 substrate, J APPL PHYS, 84(9), 1998, pp. 4921-4928