Authors: Crupi, I Lombardo, S Spinella, C Gerardi, C Fazio, B Vulpio, M Melanotte, M Liao, YG Bongiorno, C

Citation: I. Crupi et al., Memory effects in MOS capacitors with silicon quantum dots, MAT SCI E C, 15(1-2), 2001, pp. 283-285

Authors: Liao, YG Hu, SJ

Citation: Yg. Liao et Sj. Hu, An integrated model of a fixture-workpiece system for surface quality prediction, INT J ADV M, 17(11), 2001, pp. 810-818