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Results:
1-15
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Results: 15
Authors:
Boehme, C
Kanschat, P
Lips, K
Citation: C. Boehme et al., Quantum-beat recombination echoes, EUROPH LETT, 56(5), 2001, pp. 716-721
Authors:
Waiblinger, M
Lips, K
Harneit, W
Weidinger, A
Dietel, E
Hirsch, A
Citation: M. Waiblinger et al., Thermal stability of the endohedral fullerenes N@C-60, N@C-70, and P@C-60 (vol B 63, art. no. 045421, 2001) - art. no. 159901, PHYS REV B, 6415(15), 2001, pp. 9901
Authors:
Waiblinger, M
Lips, K
Harneit, W
Weidinger, A
Dietel, E
Hirsch, A
Citation: M. Waiblinger et al., Thermal stability of the endohedral fullerenes NaC60, NaC70, and PaC60 - art. no. 045421, PHYS REV B, 6304(4), 2001, pp. 5421
Authors:
Jepsen, PU
Schairer, W
Libon, IH
Lemmer, U
Hecker, NE
Birkholz, M
Lips, K
Schall, M
Citation: Pu. Jepsen et al., Ultrafast carrier trapping in microcrystalline silicon observed in opticalpump-terahertz probe measurements, APPL PHYS L, 79(9), 2001, pp. 1291-1293
Authors:
Fuhs, W
Kanschat, P
Lips, K
Citation: W. Fuhs et al., Bandtails and defects in microcrystalline silicon (mu c-Si : H), J VAC SCI B, 18(3), 2000, pp. 1792-1795
Authors:
Brehme, S
Kanschat, P
Lips, K
Sieber, I
Fuhs, W
Citation: S. Brehme et al., Electronic properties of highly P and B doped thin Si layers grown by ECR-CVD, MAT SCI E B, 69, 2000, pp. 232-237
Authors:
Birkholz, M
Kanschat, P
Weiss, T
Lips, K
Citation: M. Birkholz et al., Electron-paramagnetic resonance (EPR) and light-induced EPR investigationsof CuGaSe2, THIN SOL FI, 361, 2000, pp. 243-247
Authors:
Lips, K
Waiblinger, M
Pietzak, B
Weidinger, A
Citation: K. Lips et al., Atomic nitrogen encapsulated in fullerenes: Realization of a chemical Faraday cage, PHYS ST S-A, 177(1), 2000, pp. 81-91
Authors:
Muller, R
Kanschat, P
von Aichberger, S
Lips, K
Fuhs, W
Citation: R. Muller et al., Identification of transport and recombination paths in homo and heterojunction silicon solar cells by electrically detected magnetic resonance, J NON-CRYST, 266, 2000, pp. 1124-1128
Authors:
Kanschat, P
Lips, K
Fuhs, W
Citation: P. Kanschat et al., Identification of non-radiative recombination paths in microcrystalline silicon (mu c-Si : H), J NON-CRYST, 266, 2000, pp. 524-528
Authors:
Birkholz, M
Selle, B
Conrad, E
Lips, K
Fuhs, W
Citation: M. Birkholz et al., Evolution of structure in thin microcrystalline silicon films grown by electron-cyclotron resonance chemical vapor deposition, J APPL PHYS, 88(7), 2000, pp. 4376-4379
Authors:
Vanmoortel, I
De Strycker, J
Westbroek, P
Temmerman, E
Lips, K
Citation: I. Vanmoortel et al., Fast electrochemical method for estimation of the corrosion resistance of electrode materials in molten enamel, GLASS TECH, 41(5), 2000, pp. 156-160
Authors:
Verhoef, S
van Diemen-Steenvoorde, R
Akkersdijk, WL
Bax, NMA
Ariyurek, Y
Hermans, CJ
van Nieuwenhuizen, O
Nikkels, PGJ
Lindhout, D
Halley, DJJ
Lips, K
van den Ouweland, AMW
Citation: S. Verhoef et al., Malignant pancreatic tumour within the spectrum of tuberous sclerosis complex in childhood, EUR J PED, 158(4), 1999, pp. 284-287
Authors:
Birkholz, M
Kanschat, P
Weiss, T
Czerwensky, M
Lips, K
Citation: M. Birkholz et al., Low-temperature electron-paramagnetic-resonance study of extrinsic and intrinsic defects in CuGaSe2, PHYS REV B, 59(19), 1999, pp. 12268-12271
Authors:
Dietel, E
Hirsch, A
Pietzak, B
Waiblinger, M
Lips, K
Weidinger, A
Gruss, A
Dinse, KP
Citation: E. Dietel et al., Atomic nitrogen encapsulated in fullerenes: Effects of cage variations, J AM CHEM S, 121(11), 1999, pp. 2432-2437
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