Authors: Lo, VC Dam, XT

Citation: Vc. Lo et Xt. Dam, In-situ electromigration studies using resistometry, J MAT S-M E, 10(9), 1999, pp. 683-692

Authors: Or, SW Chan, HLW Lo, VC Yuen, CW

Citation: Sw. Or et al., Dynamics of an ultrasonic transducer used for wire bonding, IEEE ULTRAS, 45(6), 1998, pp. 1453-1460