Authors:
Vittone, E
Fizzotti, F
Gargioni, E
Lu, R
Polesello, P
LoGiudice, A
Manfredotti, C
Galassini, S
Jaksic, M
Citation: E. Vittone et al., Evaluation of the diffusion length in silicon diodes by means of the lateral IBIC technique, NUCL INST B, 158(1-4), 1999, pp. 476-480