Authors:
Han, LJ
Ong, TY
Prakash, S
Chua, LG
Choi, WK
Tan, LS
Loh, FC
Tan, KL
Citation: Lj. Han et al., Infra-red, X-ray photoelectron spectroscopy and electrical studies of r.f.sputtered amorphous silicon carbide films, THIN SOL FI, 344, 1999, pp. 441-444