Authors: Longo, DM Benson, WE Chraska, T Hull, R

Citation: Dm. Longo et al., Deep submicron microcontact printing on planar and curved substrates utilizing focused ion beam fabricated printheads, APPL PHYS L, 78(7), 2001, pp. 981-983

Authors: Longo, DM Howe, JM Johnson, WC

Citation: Dm. Longo et al., Development of a focused ion beam (FIB) technique to minimize X-ray fluorescence during energy dispersive X-ray spectroscopy (EDS) of FIB specimens in the transmission electron microscope (TEM), ULTRAMICROS, 80(2), 1999, pp. 69-84

Authors: Longo, DM Howe, JM Johnson, WC

Citation: Dm. Longo et al., Experimental method for determining Cliff-Lorimer factors in transmission electron microscopy (TEM) utilizing stepped wedge-shaped specimens preparedby focused ion beam (FIB) thinning, ULTRAMICROS, 80(2), 1999, pp. 85-97