Authors: Ahaitouf, A Losson, E Bath, A

Citation: A. Ahaitouf et al., On the determination of interface state density in n-InP Schottky structures by current-voltage measurements - Comparison with DLTS results, SOL ST ELEC, 44(3), 2000, pp. 515-520

Authors: Ahaitouf, A Losson, E Charles, JP

Citation: A. Ahaitouf et al., A new determination of minority carrier generation characteristics in a MOS channel - CCD process by DLTS, SOL ST ELEC, 43(7), 1999, pp. 1225-1230