Authors:
Barmak, K
Rickman, JM
Michaelsen, C
Ristau, RA
Kim, J
Lucadamo, GA
Carpenter, DT
Tong, WS
Citation: K. Barmak et al., Ex situ characterization of phase transformations and associated microstructures in polycrystalline thin films, J VAC SCI A, 17(4), 1999, pp. 1950-1957