Authors:
Gebauer, J
Borner, F
Krause-Rehberg, R
Staab, TEM
Bauer-Kugelmann, W
Kogel, G
Triftshauser, W
Specht, P
Lutz, RC
Weber, ER
Luysberg, M
Citation: J. Gebauer et al., Defect identification in GaAs grown at low temperatures by positron annihilation, J APPL PHYS, 87(12), 2000, pp. 8368-8379
Authors:
Specht, P
Lutz, RC
Zhao, R
Weber, ER
Liu, WK
Bacher, K
Towner, FJ
Stewart, TR
Luysberg, M
Citation: P. Specht et al., Improvement of molecular beam epitaxy-grown low-temperature GaAs through pdoping with Be and C, J VAC SCI B, 17(3), 1999, pp. 1200-1204
Authors:
Haiml, M
Siegner, U
Morier-Genoud, F
Keller, U
Luysberg, M
Lutz, RC
Specht, P
Weber, ER
Citation: M. Haiml et al., Optical nonlinearity in low-temperature-grown GaAs: Microscopic limitations and optimization strategies, APPL PHYS L, 74(21), 1999, pp. 3134-3136