Authors:
CAPPER P
OKEEFE ES
MAXEY C
DUTTON D
MACKETT P
BUTLER C
GALE I
Citation: P. Capper et al., MATRIX AND IMPURITY ELEMENT DISTRIBUTIONS IN CDHGTE (CMT) AND (CD,ZN)(TE,SE) COMPOUNDS BY CHEMICAL-ANALYSIS, Journal of crystal growth, 161(1-4), 1996, pp. 104-118
Authors:
GRAINGER F
GALE IG
CAPPER P
MAXEY CD
MACKETT P
OKEEFE E
GOSNEY J
Citation: F. Grainger et al., IMPURITY SURVEY ANALYSIS OF CDXHG1-XTE BY LASER SCAN MASS-SPECTROMETRY, Advanced materials for optics and electronics, 5(2), 1995, pp. 71-78
Authors:
GALE IG
CLEGG JB
CAPPER P
MAXEY CD
MACKETT P
OKEEFE E
Citation: Ig. Gale et al., MEASUREMENT OF CDXHG1-XTE COMPOSITION DEPTH PROFILES USING AUGER-ELECTRON SPECTROMETRY ON BEVELED SECTIONS, Advanced materials for optics and electronics, 5(2), 1995, pp. 79-86