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RIEPE K
GEYER A
MAILE BE
SCHURR A
BERG M
DAEMBKES H
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Citation: Be. Maile et al., IMPACT OF PROXIMITY CORRECTION ON DEVICE YIELD IN ELECTRON-BEAM DEFINITION OF MSM-DETECTORS, Microelectronic engineering, 30(1-4), 1996, pp. 35-40
Authors:
DICKMANN J
SCHILDBERG S
RIEPE K
MAILE BE
SCHURR A
GEYER A
NAROZNY P
Citation: J. Dickmann et al., BREAKDOWN MECHANISMS IN PSEUDOMORPHIC INALAS INXGA1-XAS HIGH-ELECTRON-MOBILITY TRANSISTORS ON INP .2. ON-STATE/, JPN J A P 1, 34(4A), 1995, pp. 1805-1808
Authors:
DICKMANN J
SCHILDBERG S
RIEPE K
MAILE BE
SCHURR A
GEYER A
NAROZNY P
Citation: J. Dickmann et al., BREAKDOWN MECHANISMS IN PSEUDOMORPHIC INALAS INXGA1-X HIGH-ELECTRON-MOBILITY TRANSISTORS ON INP .1. OFF-STATE/, JPN J A P 1, 34(1), 1995, pp. 66-71
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