AAAAAA

   
Results: 1-2 |
Results: 2
ELECTROMIGRATION FAILURE OF INTEGRATED-CIRCUIT METALLIZATIONS SUBJECTED TO HIGH-FREQUENCY PULSED CURRENTS
Authors: MALONE DW HUMMEL RE
Citation: Dw. Malone et Re. Hummel, ELECTROMIGRATION FAILURE OF INTEGRATED-CIRCUIT METALLIZATIONS SUBJECTED TO HIGH-FREQUENCY PULSED CURRENTS, Journal of applied physics, 83(11), 1998, pp. 5750-5760
ELECTROMIGRATION IN INTEGRATED-CIRCUITS
Authors: MALONE DW HUMMEL RE
Citation: Dw. Malone et Re. Hummel, ELECTROMIGRATION IN INTEGRATED-CIRCUITS, Critical reviews in solid state and materials sciences, 22(3), 1997, pp. 199-238
Risultati: 1-2 |