Authors:
KOWALSKI G
GRONKOWSKI J
HARASIMOWICZ T
MOORE M
MARICIC Z
NOSSARZEWSKAORLOWSKA E
BRZOZOWSKI A
Citation: G. Kowalski et al., X-RAY-DIFFRACTION STUDY OF POROUS SILICON LAYERS ETCHED ON (111)-ORIENTED P(+) SUBSTRATE, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(2-4), 1997, pp. 561-570
Citation: G. Kowalski et al., SYNCHROTRON X-RAY STUDIES OF STRAIN IN (100)-ORIENTED HIGH-PRESSURE HIGH-TEMPERATURE (HP-HT) SYNTHETIC DIAMONDS, DIAMOND AND RELATED MATERIALS, 5(11), 1996, pp. 1254-1263
Citation: G. Kowalski et al., DOUBLE-CRYSTAL DIFFRACTOMETRIC AND TOPOGRAPHIC STUDIES OF (111) ORIENTED SYNTHETIC DIAMONDS, Journal of physics. D, Applied physics, 29(3), 1996, pp. 793-800