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Results: 2
EVALUATION OF LOW-TEMPERATURE INTERDIFFUSION COEFFICIENTS IN HG-BASEDSUPERLATTICES BY MONITORING THE E-1 REFLECTANCE PEAK
Authors: MATTSON MA MYERS TH RICHARDSBABB M MEYER JR
Citation: Ma. Mattson et al., EVALUATION OF LOW-TEMPERATURE INTERDIFFUSION COEFFICIENTS IN HG-BASEDSUPERLATTICES BY MONITORING THE E-1 REFLECTANCE PEAK, Journal of electronic materials, 26(6), 1997, pp. 578-583
REFLECTANCE AND PHOTOREFLECTANCE FOR IN-SITU MONITORING OF THE MOLECULAR-BEAM EPITAXIAL-GROWTH OF CDTE AND HG-BASED MATERIALS
Authors: YU ZH MATTSON MA MYERS TH HARRIS KA YANKA RW MOHNKERN LM VOON LCLY RAMMOHAN LR BENZ RG WAGNER BK SUMMERS CJ
Citation: Zh. Yu et al., REFLECTANCE AND PHOTOREFLECTANCE FOR IN-SITU MONITORING OF THE MOLECULAR-BEAM EPITAXIAL-GROWTH OF CDTE AND HG-BASED MATERIALS, Journal of electronic materials, 24(5), 1995, pp. 685-690
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