Authors: HEBERT KJ ZAFAR S IRENE EA KUEHN R MCCARTHY TE DEMIRLIOGLU EK

Citation: Kj. Hebert et al., MEASUREMENT OF THE REFRACTIVE-INDEX OF THIN SIO2-FILMS USING TUNNELING CURRENT OSCILLATIONS AND ELLIPSOMETRY, Applied physics letters, 68(2), 1996, pp. 266-268