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Citation: Bv. Zhmud et al., EVALUATION OF SURFACE-IONIZATION PARAMETERS FROM AFM DATA, Journal of colloid and interface science (Print), 207(2), 1998, pp. 332-343

Authors: MEURK A LUCKHAM PF BERGSTROM L

Citation: A. Meurk et al., DIRECT MEASUREMENT OF REPULSIVE AND ATTRACTIVE VAN-DER-WAALS-FORCES BETWEEN INORGANIC MATERIALS, Langmuir, 13(14), 1997, pp. 3896-3899