Authors: BRAUN EK SHENOY KV FONSTAD CG MIKKELSON JM

Citation: Ek. Braun et al., ELEVATED-TEMPERATURE STABILITY OF GAAS DIGITAL INTEGRATED-CIRCUITS, IEEE electron device letters, 17(2), 1996, pp. 37-39

Authors: SHENOY KV FONSTAD CG MIKKELSON JM

Citation: Kv. Shenoy et al., HIGH-TEMPERATURE STABILITY OF REFRACTORY-METAL VLSI GAAS-MESFETS, IEEE electron device letters, 15(3), 1994, pp. 106-108