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Authors: TABBAL M MEREL P MOISA S CHAKER M GAT E RICARD A MOISAN M GUJRATHI S
Citation: M. Tabbal et al., XPS AND FTIR ANALYSIS OF NITROGEN INCORPORATION IN CNX THIN-FILMS, Surface & coatings technology, 98(1-3), 1998, pp. 1092-1096

Authors: MEREL P TABBAL M CHAKER M MOISA S MARGOT J
Citation: P. Merel et al., DIRECT EVALUATION OF THE SP(3) CONTENT IN DIAMOND-LIKE-CARBON FILMS BY XPS, Applied surface science, 136(1-2), 1998, pp. 105-110

Authors: TABBAL M MEREL P MOISA S CHAKER M RICARD A MOISAN M
Citation: M. Tabbal et al., X-RAY PHOTOELECTRON-SPECTROSCOPY OF CARBON NITRIDE FILMS DEPOSITED BYGRAPHITE LASER-ABLATION IN A NITROGEN POSTDISCHARGE, Applied physics letters, 69(12), 1996, pp. 1698-1700

Authors: VASILIU F MOISA S GROZEA D BUNESCU C
Citation: F. Vasiliu et al., INVESTIGATION OF THE PHASE-COMPOSITION IN SINTERED LANTHANA-DOPED (ZR,SN) TIO4 CERAMICS, Journal of Materials Science, 29(12), 1994, pp. 3337-3341
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