Authors: MONTGOMERY PC BENHADDOU D MONTANER D

Citation: Pc. Montgomery et al., INTERFEROMETRIC ROUGHNESS MEASUREMENT OF OHMIC CONTACT III-V SEMICONDUCTOR INTERFACES, Applied physics letters, 71(13), 1997, pp. 1768-1770

Authors: MONTGOMERY PC VABRE P MONTANER D FILLARD JP

Citation: Pc. Montgomery et al., CHARACTERIZATION OF III-V MATERIALS BY OPTICAL INTERFEROMETRY, Journal de physique. III, 3(9), 1993, pp. 1791-1802

Authors: MONTGOMERY PC MONTANER D JACOBONI C BOULARD B FILLARD JP

Citation: Pc. Montgomery et al., NONDESTRUCTIVE OPTICAL INSPECTION OF EVAPORATED FLUORIDE GLASS LAYERS, Journal of non-crystalline solids, 161, 1993, pp. 81-85