Authors: YOUNG SM BROZEL MR MOORE CJL

Citation: Sm. Young et al., NONCONTACTING SPATIALLY-RESOLVED MEASUREMENTS OF FERMI ENERGY AND PHOTOCONDUCTIVITY IN SEMIINSULATING UNDOPED GAAS AND INP-FE, Materials science & engineering. B, Solid-state materials for advanced technology, 44(1-3), 1997, pp. 203-207

Authors: BULITKA NJ MOORE CJL HENNESSY J TOMPA GS ZAWADZKI P WOLAK E

Citation: Nj. Bulitka et al., CHARACTERIZATION OF BRAGG REFLECTOR STRUCTURES USING SCANNING REFLECTANCE SPECTRAL MAPPING, Materials science & engineering. B, Solid-state materials for advanced technology, 28(1-3), 1994, pp. 457-460

Authors: TOMPA GS ZAWADZKI PA MOY K MCKEE M THOMPSON AG GURARY AI WOLAK E ESHERICK P BREILAND WG EVANS GH BULITKA N HENNESSY J MOORE CJL

Citation: Gs. Tompa et al., DESIGN AND OPERATING CHARACTERISTICS OF A METALORGANIC VAPOR-PHASE EPITAXY PRODUCTION SCALE, VERTICAL, HIGH-SPEED, ROTATING-DISK REACTOR, Journal of crystal growth, 145(1-4), 1994, pp. 655-661

Authors: MOORE CJL HENNESSY J

Citation: Cjl. Moore et J. Hennessy, THE EFFECTS OF PROBE POWER ON THE SPATIAL VARIATION OF THE ROOM-TEMPERATURE PHOTOLUMINESCENCE WAVELENGTH OF AN INGAASP EPITAXIAL STRUCTURE, Materials science & engineering. B, Solid-state materials for advanced technology, 20(1-2), 1993, pp. 190-197

Authors: MOORE CJL HENNESSY J

Citation: Cjl. Moore et J. Hennessy, THE EFFECTS OF PROBE SPOT SIZE AND SAMPLING GRID DENSITY ON PROCESS-CONTROL VALUES DERIVED FROM PHOTOLUMINESCENCE MAPPING, Materials science & engineering. B, Solid-state materials for advanced technology, 20(1-2), 1993, pp. 198-202