Authors: DUMIN DJ MADDUX JR SUBRAMONIAM R SCOTT RS VANCHINATHAN S DUMIN NA DICKERSON KJ MOPURI S GLADSTONE SM HUGHES TW

Citation: Dj. Dumin et al., CHARACTERIZING WEAROUT, BREAKDOWN, AND TRAP GENERATION IN THIN SILICON-OXIDE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(4), 1995, pp. 1780-1787

Authors: DUMIN DJ VANCHINATHAN S MOPURI S SUBRAMONIAM R

Citation: Dj. Dumin et al., EVIDENCE FOR NONUNIFORM TRAP DISTRIBUTIONS IN THIN OXIDES AFTER HIGH-VOLTAGE STRESSING, Journal of the Electrochemical Society, 142(6), 1995, pp. 2055-2059