Authors: MUNKHOLM A THOMPSON C FOSTER CM EASTMAN JA AUCIELLO O STEPHENSON GB FINI P DENBAARS SP SPECK JS

Citation: A. Munkholm et al., DETERMINATION OF THE CUBIC TO HEXAGONAL FRACTION IN GAN NUCLEATION LAYERS USING GRAZING-INCIDENCE X-RAY-SCATTERING, Applied physics letters, 72(23), 1998, pp. 2972-2974

Authors: MUNKHOLM A BRENNAN S COMIN F ORTEGA L

Citation: A. Munkholm et al., OBSERVATION OF A DISTRIBUTED EPITAXIAL OXIDE IN THERMALLY GROWN SIO2 ON SI(001) - REPLY, Physical review letters, 79(24), 1997, pp. 4933-4933

Authors: MUNKHOLM A BRENNAN S CARR EC

Citation: A. Munkholm et al., A COMPARISON OF SURFACE-ROUGHNESS AS MEASURED BY ATOMIC-FORCE MICROSCOPY AND X-RAY-SCATTERING, Journal of applied physics, 82(6), 1997, pp. 2944-2953

Authors: MUNKHOLM A BRENNAN S COMIN F ORTEGA L

Citation: A. Munkholm et al., OBSERVATION OF A DISTRIBUTED EPITAXIAL OXIDE IN THERMALLY GROWN SIO2 ON SI(001), Physical review letters, 75(23), 1995, pp. 4254-4257

Authors: SCHUSTER M LESSMANN A MUNKHOLM A BRENNAN S MATERLIK G RIECHERT H

Citation: M. Schuster et al., HIGH-RESOLUTION X-RAY-DIFFRACTION AND X-RAY STANDING-WAVE ANALYSES OF(ALAS)(M)(GAAS)(N) SHORT-PEROID SUPERLATTICES, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 206-211