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Results: 1-11 |
Results: 11
SELECTED PAPERS OF THE INTERNATIONAL WORKSHOP ON CHALLENGES IN PREDICTIVE PROCESS SIMULATION (CHIPPS-97) - WANDLITZ, GERMANY 17-20 AUGUST 1997 - PREFACE
Authors: DABROWSKI J MUSSIG HJ
Citation: J. Dabrowski et Hj. Mussig, SELECTED PAPERS OF THE INTERNATIONAL WORKSHOP ON CHALLENGES IN PREDICTIVE PROCESS SIMULATION (CHIPPS-97) - WANDLITZ, GERMANY 17-20 AUGUST 1997 - PREFACE, Computational materials science, 11(2), 1998, pp. 5-6
SEPARATION OF THE BULK AND SURFACE COMPONENTS IN AUGER-ELECTRON SPECTROSCOPY
Authors: ARABCZYK W MUSSIG HJ DABROWSKI J MOSZYNSKI D HINRICH S
Citation: W. Arabczyk et al., SEPARATION OF THE BULK AND SURFACE COMPONENTS IN AUGER-ELECTRON SPECTROSCOPY, Applied surface science, 135(1-4), 1998, pp. 59-64
SURFACE RECONSTRUCTION SUGGESTS A NUCLEATION MECHANISM IN BULK - SB SI(113) AND (113)PLANAR DEFECTS/
Authors: DABROWSKI J MUSSIG HJ WOLFF G HINRICH S
Citation: J. Dabrowski et al., SURFACE RECONSTRUCTION SUGGESTS A NUCLEATION MECHANISM IN BULK - SB SI(113) AND (113)PLANAR DEFECTS/, Surface science, 411(1-2), 1998, pp. 54-60
LOW-COVERAGE ADSORPTION OF SB-4 ON SI(113) STUDIED BY SCANNING-TUNNELING-MICROSCOPY
Authors: MUSSIG HJ DABROWSKI J ARABCZYK W HINRICH S WOLFF G
Citation: Hj. Mussig et al., LOW-COVERAGE ADSORPTION OF SB-4 ON SI(113) STUDIED BY SCANNING-TUNNELING-MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 982-987
MICROSCOPIC PICTURE OF SI(113) - A NOVEL SURFACE RECONSTRUCTION, THE ORIGIN OF DEFECTS, AND THE PROCESS OF ADSORPTION - THEORETICAL AND EXPERIMENTAL-STUDY
Authors: DABROWSKI J MUSSIG HJ WOLFF G
Citation: J. Dabrowski et al., MICROSCOPIC PICTURE OF SI(113) - A NOVEL SURFACE RECONSTRUCTION, THE ORIGIN OF DEFECTS, AND THE PROCESS OF ADSORPTION - THEORETICAL AND EXPERIMENTAL-STUDY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(4), 1995, pp. 1597-1601
MICROMORPHOLOGY OF GE AND SI1-XGEX LAYERS GROWN ON SI(001) BY SOLUTION EPITAXY AND THE NEGATIVE-DIFFERENTIAL CONDUCTIVITY ON THE GE LAYER
Authors: MUSSIG HJ KRUGER D HINRICH S HANSSON PO
Citation: Hj. Mussig et al., MICROMORPHOLOGY OF GE AND SI1-XGEX LAYERS GROWN ON SI(001) BY SOLUTION EPITAXY AND THE NEGATIVE-DIFFERENTIAL CONDUCTIVITY ON THE GE LAYER, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(3), 1995, pp. 1342-1347
THE RECONSTRUCTION OF THE SI(113) SURFACE STUDIED BY SCANNING TUNNELING MICROSCOPE
Authors: ARABCZYK W HINRICH S MUSSIG HJ
Citation: W. Arabczyk et al., THE RECONSTRUCTION OF THE SI(113) SURFACE STUDIED BY SCANNING TUNNELING MICROSCOPE, Vacuum, 46(5-6), 1995, pp. 473-476
A NOVEL SURFACE RECONSTRUCTION - SUBSURFACE INTERSTITIALS STABILIZE SI(113)3X2
Authors: DABROWSKI J MUSSIG HJ WOLFF G
Citation: J. Dabrowski et al., A NOVEL SURFACE RECONSTRUCTION - SUBSURFACE INTERSTITIALS STABILIZE SI(113)3X2, Surface science, 333, 1995, pp. 1022-1027
NEGATIVE-DIFFERENTIAL CONDUCTIVITY MEASURED ON A GERMANIUM LAYER ON SI(001)
Authors: MUSSIG HJ KRUGER D HINRICH S HANSSON PO
Citation: Hj. Mussig et al., NEGATIVE-DIFFERENTIAL CONDUCTIVITY MEASURED ON A GERMANIUM LAYER ON SI(001), Surface science, 314(3), 1994, pp. 120000884-120000888
HYDROGEN ADSORPTION ON RH(110) STUDIED BY HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY
Authors: MUSSIG HJ STENZEL W SONG Y CONRAD H
Citation: Hj. Mussig et al., HYDROGEN ADSORPTION ON RH(110) STUDIED BY HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY, Surface science, 311(3), 1994, pp. 295-307
ATOMIC-STRUCTURE OF CLEAN SI(113) SURFACES - THEORY AND EXPERIMENT
Authors: DABROWSKI J MUSSIG HJ WOLFF G
Citation: J. Dabrowski et al., ATOMIC-STRUCTURE OF CLEAN SI(113) SURFACES - THEORY AND EXPERIMENT, Physical review letters, 73(12), 1994, pp. 1660-1663
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