Authors:
Baniecki, JD
Laibowitz, RB
Shaw, TM
Saenger, KL
Duncombe, PR
Cabral, C
Kotecki, DE
Shen, H
Lian, J
Ma, QY
Citation: Jd. Baniecki et al., Effects of annealing conditions on charge loss mechanisms in MOCVD Ba0.7Sr0.3TiO3 thin film capacitors, J EUR CERAM, 19(6-7), 1999, pp. 1457-1461
Authors:
Miller, JR
Hurlston, SE
Ma, QY
Face, DW
Kountz, DJ
MacFall, JR
Hedlund, LW
Johnson, GA
Citation: Jr. Miller et al., Performance of a high-temperature superconducting probe for in vivo microscopy at 2.0 T, MAGN RES M, 41(1), 1999, pp. 72-79