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Results:
1-7
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Results: 7
Authors:
Charvet, S
Madelon, R
Rizk, R
Citation: S. Charvet et al., Structural, ellipsometry and photoluminescence spectroscopy studies of silicon nanograins embedded in a silica matrix, SOL ST ELEC, 45(8), 2001, pp. 1505-1511
Authors:
Gourbilleau, F
Portier, X
Ternon, C
Voivenel, P
Madelon, R
Rizk, R
Citation: F. Gourbilleau et al., Si-rich/SiO2 nanostructured multilayers by reactive magnetron sputtering, APPL PHYS L, 78(20), 2001, pp. 3058-3060
Authors:
Charvet, S
Madelon, R
Rizk, R
Citation: S. Charvet et al., Dielectric and photoluminescence properties of silicon nanoparticles embedded in a silica matrix, MICROEL REL, 40(4-5), 2000, pp. 855-858
Authors:
Achiq, A
Rizk, R
Madelon, R
Gourbilleau, F
Voivenel, P
Citation: A. Achiq et al., Effects of pre-hydrogenation on the relaxation and bandgap variation of thermally nanocrystallized silicon layers, PHIL MAG B, 79(5), 1999, pp. 777-791
Authors:
Charvet, S
Madelon, R
Gourbilleau, F
Rizk, R
Citation: S. Charvet et al., Spectroscopic ellipsometry analyses of sputtered Si/SiO2 nanostructures, J APPL PHYS, 85(8), 1999, pp. 4032-4039
Authors:
Charvet, S
Madelon, R
Rizk, R
Garrido, B
Gonzalez-Varona, O
Lopez, M
Perez-Rodriguez, A
Morante, JR
Citation: S. Charvet et al., Substrate temperature dependence of the photoluminescence efficiency of co-sputtered Si/SiO2 layers, J LUMINESC, 80(1-4), 1998, pp. 241-245
Authors:
Charvet, S
Madelon, R
Gourbilleau, F
Rizk, R
Citation: S. Charvet et al., Ellipsometric spectroscopy study of photoluminescent Si/SiO2 systems obtained by magnetron co-sputtering, J LUMINESC, 80(1-4), 1998, pp. 257-261
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1-7
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