Authors:
Pesiri, DR
Snow, RC
Elliott, N
Maggiore, C
Dye, RC
Citation: Dr. Pesiri et al., The characterization of asymmetric alumina membranes by Rutherford backscattering spectrometry, J MEMBR SCI, 176(2), 2000, pp. 209-221
Authors:
Wayne, DM
Schulze, RK
Maggiore, C
Cooke, DW
Havrilla, G
Citation: Dm. Wayne et al., Characterization of tantalum films on analytical surfaces: Insights into sputtering of nonconductors in a direct-current glow discharge using secondary cathodes, APPL SPECTR, 53(3), 1999, pp. 266-277