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Results: 1-10 |
Results: 10
Behavior of ultrathin Al2O3 films in very high electric fields: Scanning tunneling microscope-induced void formation and dielectric breakdown
Authors: Niu, C Magtoto, NP Kelber, JA
Citation: C. Niu et al., Behavior of ultrathin Al2O3 films in very high electric fields: Scanning tunneling microscope-induced void formation and dielectric breakdown, J VAC SCI A, 19(4), 2001, pp. 1947-1952
STM-induced void formation at the Al2O3/Ni3Al(111) interface
Authors: Magtoto, NP Niu, C Anzaldua, M Kelber, JA Jennison, DR
Citation: Np. Magtoto et al., STM-induced void formation at the Al2O3/Ni3Al(111) interface, SURF SCI, 472(3), 2001, pp. L157-L163
Copper wetting of a tantalum silicate surface: Implications for interconnect technology
Authors: Zhao, X Leavy, M Magtoto, NP Kelber, JA
Citation: X. Zhao et al., Copper wetting of a tantalum silicate surface: Implications for interconnect technology, APPL PHYS L, 79(21), 2001, pp. 3479-3481
Interactions at the Ni3Al(111)-S-Al2O3 interface at elevated temperatures:Ordering of Al2O3 on S-modified substrate
Authors: Addepalli, S Magtoto, NP Kelber, JA
Citation: S. Addepalli et al., Interactions at the Ni3Al(111)-S-Al2O3 interface at elevated temperatures:Ordering of Al2O3 on S-modified substrate, LANGMUIR, 16(22), 2000, pp. 8352-8359
H2S adsorption and the effect of sulfur on the oxidation of Ni3Al(111)
Authors: Addepalli, SG Magtoto, NP Kelber, JA
Citation: Sg. Addepalli et al., H2S adsorption and the effect of sulfur on the oxidation of Ni3Al(111), SURF SCI, 458(1-3), 2000, pp. 123-134
S-induced destabilization of aluminum oxide at the Fe(poly)-S-Al2O3 interface
Authors: Chen, L Magtoto, NP Addepalli, S Ekstrom, B Kelber, JA
Citation: L. Chen et al., S-induced destabilization of aluminum oxide at the Fe(poly)-S-Al2O3 interface, OXID METAL, 54(3-4), 2000, pp. 285-300
Dielectric breakdown of ultrathin aluminum oxide films induced by scanningtunneling microscopy
Authors: Magtoto, NP Niu, C Ekstrom, BM Addepalli, S Kelber, JA
Citation: Np. Magtoto et al., Dielectric breakdown of ultrathin aluminum oxide films induced by scanningtunneling microscopy, APPL PHYS L, 77(14), 2000, pp. 2228-2230
STM atomic-scale characterization of the gamma '-Al2O3 film on Ni3Al(111)
Authors: Addepalli, SG Ekstrom, B Magtoto, NP Lin, JS Kelber, JA
Citation: Sg. Addepalli et al., STM atomic-scale characterization of the gamma '-Al2O3 film on Ni3Al(111), SURF SCI, 442(3), 1999, pp. 385-399
Two-dimensional FT-IR correlation analysis of the chemisorption of nitric oxide on Pt(100)
Authors: Magtoto, NP Sefara, NL Richardson, HH
Citation: Np. Magtoto et al., Two-dimensional FT-IR correlation analysis of the chemisorption of nitric oxide on Pt(100), APPL SPECTR, 53(2), 1999, pp. 178-183
In situ infrared reflection-absorption spectroscopic characterization of sustained kinetic oscillations in the Pt(100)/NO+CO system
Authors: Magtoto, NP Richardson, HH
Citation: Np. Magtoto et Hh. Richardson, In situ infrared reflection-absorption spectroscopic characterization of sustained kinetic oscillations in the Pt(100)/NO+CO system, SURF SCI, 417(2-3), 1998, pp. 189-200
Risultati: 1-10 |