ACNP - Italian Periodicals Catalogue

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Results: 1-11 |

Results: 11

Quality inspection of anisotropic scintillating lead tungstate (PbWO4) crystals through measurement of interferometric fringe pattern parameters

Authors: Cocozzella, N Lebeau, M Majni, G Paone, N Rinaldi, D

Citation: N. Cocozzella et al., Quality inspection of anisotropic scintillating lead tungstate (PbWO4) crystals through measurement of interferometric fringe pattern parameters, NUCL INST A, 469(3), 2001, pp. 331-339

Chitosan-oxychitin coatings for prosthetic materials

Authors: Muzzarelli, RAA Biagini, G DeBenedittis, A Mengucci, P Majni, G Tosi, G

Citation: Raa. Muzzarelli et al., Chitosan-oxychitin coatings for prosthetic materials, CARBOHY POL, 45(1), 2001, pp. 35-41

Monoclinic carbon nitride phase coherently grown on Si (001) substrates

Authors: Barucca, G Majni, G Mengucci, P Leggieri, G Martino, M

Citation: G. Barucca et al., Monoclinic carbon nitride phase coherently grown on Si (001) substrates, J APPL PHYS, 89(6), 2001, pp. 3494-3497

Si/SiGe modulation-doped heterostructures grown on silicon-on-insulator substrates for high-mobility two-dimensional electron gases

Authors: Di Gaspare, L Alfaramawi, K Evangelisti, F Palange, E Barucca, G Majni, G

Citation: L. Di Gaspare et al., Si/SiGe modulation-doped heterostructures grown on silicon-on-insulator substrates for high-mobility two-dimensional electron gases, APPL PHYS L, 79(13), 2001, pp. 2031-2033

Characterisation of ferroelectric thin films by X-ray diffraction and electron microscopy

Authors: Mengucci, P De Benedittis, A Di Cristoforo, A Majni, G Watts, BE Leccabue, F

Citation: P. Mengucci et al., Characterisation of ferroelectric thin films by X-ray diffraction and electron microscopy, INT J INORG, 2(2-3), 2000, pp. 249-254

Carbon nitride films deposited by very high-fluence XeCl excimer-laser reactive ablation

Authors: Acquaviva, S D'Anna, E De Giorgi, ML Fernandez, M Leggieri, G Luches, A Zocco, A Majni, G

Citation: S. Acquaviva et al., Carbon nitride films deposited by very high-fluence XeCl excimer-laser reactive ablation, APPL SURF S, 154, 2000, pp. 369-375

Thermal behaviour of Co/Si/W/Si multilayers under high intensity excimer laser pulses

Authors: Majkova, E Luby, S Anopchenko, A Jergel, M Luches, A Martino, M Mengucci, P Majni, G

Citation: E. Majkova et al., Thermal behaviour of Co/Si/W/Si multilayers under high intensity excimer laser pulses, APPL SURF S, 139, 1999, pp. 477-481

Intermixing in immiscible Co/Ag/Co trilayers under XeCl laser annealing

Authors: D'Anna, E Leggieri, G Luches, A Martino, M Majni, G Barucca, G Mengucci, P Luby, S Majkova, E Jergel, M

Citation: E. D'Anna et al., Intermixing in immiscible Co/Ag/Co trilayers under XeCl laser annealing, THIN SOL FI, 344, 1999, pp. 206-209

Photoluminescence investigation of short period silicon-germanium heterostructures grown using molecular beam epitaxy

Authors: Pinto, N Tombolini, F Murri, R De Crescenzi, M Casalboni, M Barucca, G Majni, G

Citation: N. Pinto et al., Photoluminescence investigation of short period silicon-germanium heterostructures grown using molecular beam epitaxy, SURF SCI, 437(1-2), 1999, pp. 145-153

New carbon nitride phase coherently grown on Si(111)

Authors: Barucca, G Majni, G Mengucci, P Leggieri, G Luches, A Martino, M Perrone, A

Citation: G. Barucca et al., New carbon nitride phase coherently grown on Si(111), J APPL PHYS, 86(4), 1999, pp. 2014-2019

Short period (Si6Ge4)(p) superlattices: photoluminescence and electron microscopy study

Authors: Pinto, N Tombolini, F Murri, R De Crescenzi, M Casalboni, M Barucca, G Majni, G

Citation: N. Pinto et al., Short period (Si6Ge4)(p) superlattices: photoluminescence and electron microscopy study, J LUMINESC, 80(1-4), 1998, pp. 509-513

Risultati: 1-11 |